• 成都集佳科技有限公司

󰀆 封装品种

  • TO 系列

Production Overview

Plastic Transistor Outline packaging (TO) is a principal package using TH or SMD technology. It is widely used in low cost and manual applications. CDPT offers TO251(IPAK), TO252(DPAK), TO263(DDPAK), TO220 ,TO262,TO220F,TO247 ,TO3P packages.

Application

Transistor Outline packages are considered one of the most established industry standard packages. TO is commonly used power supplies, converters and power motor controls, Hand-held Instruments battery powered consumer products,etc.

Features

* JEDEC standard compliant or reference

* Wide choice of pad sizes to meet die size per customer lead frame design capability

* Pb-free process ready and Green Molding Compound

Reliability Test Standards

The test criterion is zero defect out of 77 sampling units.

JEDEC Precondition :J-STD-20/JESD22-A113

Temp/Humidity Test 85°C/ 85% RH, JEDEC 22- A101
Pressure Cooker Test121°C/ 100% RH/ 15 PSIG, JEDEC 22- A102
Temp Cycle Test-65 ~ 150°C, JEDEC22-A104
High Temp Storage Test150°C, JEDEC 22- A103
High Accelerated Stress Test130°C/ 85% RH/ 33.5 PSIA, JEDEC 22- A110/A118

Design Rule

Minimum Ink Size: 20mil (500 um) diameter or non-ink with wafer mapping

Maximum Ink Height: 1mil(25um)

Minimum Sawing street width: 2.4mil (60um)

Wafer Thickness: Back grinding is required if the thickness exceeds CDPT spec.

Pkg type Pkg sizeWafer thickness
TOAllMin4mil (100 um)
If that is asked to use soft solder for the die attachment, the wafer can not be backgrinding.

Wire Bond Rule

现有能力

Wire BondingGold WireCopper WireAL WireAL ribbon
Wire Diameter0.7~2mil(18~50µm)0.8~1.5mil(20~38µm)5~20mil(125~500µm)20*3mil~80*10mil
Min BPO40*40µm60*60µm490*430µm\
Min BPO Pitch45µm70µm560µm\
Max wire length5000µm5000µm\\
Min wire length\\200µm\

Package Outline

PKG TYPELead countLead PitchLead WidthLeadThicknessBDPOD
TO-251D-3L32.1860.720.47 DOWN DOWN
TO-252-2L22.1860.720.47 DOWN DOWN
TO-251Q-3L32.1860.720.47 DOWN DOWN
TO-251J-3L32.240.560.46 DOWN DOWN
TO-3P35.450.800.50 DOWN DOWN
TO-24735.4361.160.59 DOWN DOWN
TO-220-2L25.080.700.45 DOWN DOWN
TO-220-3L32.540.700.45 DOWN DOWN
TO-262-3L32.540.760.47 DOWN DOWN
TO-263-2L22.540.760.47 DOWN DOWN
TO-220F-2L25.080.700.45 DOWN DOWN
TO-220F-3L32.540.700.45 DOWN DOWN
TO-220FQ-3L32.540.760.46 DOWN DOWN

Packing & Shipping

Tube

PKG TYPELead countQTY/TubeTube/inner BoxQTY/Outer Box
TO25137512036000
TO25227512036000
TO262350408000
TO263350408000
TO2202/350408000
TO220F2/350408000
TO3P330203000
TO2472/330203000

Carrier Tape

PKG TYPELead countTape WidthReel DiameterQTY/ReelQTY/Outer Box
TO252220mm13"250025000
TO2632/324mm13"8008000
  • IPM 系列
PKG TYPELead countPIC
DIP-23E-W/DG23
DIP-23H-W23
SOP-23H-W/DG23
DIP-24H-TG/DG24
DIP-25A-DG/W25
DIP-27H-TG27
SOP-27H-TG27

IPM Packing & Shipping

PKG TYPELead countQTY/TubeTube/inner BoxQTY/Outer Box
DIP232315202400
SOP232315161920
DIP2424125480
DIP252513202080
DIP2727106480
SOP272722508800

󰀆可靠性实验能力

分立器件 试验项目 &试验条件&判定标准

试验项目
Test Item
试验条件
Test Condition
参考标准
Reference document
选样数
Sample size
判断标准
(A/R)
高压蒸煮试验
AC(Autoclave)
121 ℃, 29.7 psi, 100% RH, 96hrs JESD22-A10222/45/770/1
高加速老化试验
HAST(Highly Accelerated Stress Test)
TA =130℃, 85% RH, 230Kpa, Vds=80%Spec(42V max) 96hrs JESD22-A11022/45/770/1
高温反偏试验
HTRB(High Temperature Reverse Bias)
TJ = 150℃/specified TJ(max),Vds=80%Spec 1000Hrs JESD22A-108
AEC-Q101
22/45/770/1
高温栅极反偏试验
HTGB(High Temperature Gate Bias)
TJ = 150℃/specified TJ(max),Vgs=100%Spec 1000Hrs JESD22A-108
AEC-Q101
22/45/770/1
高温高湿偏压
H3TRB(High Humidity, High Temperature Reverse Bias)
85℃;85% RH; Vgs=80%spec 100V MAX,1000Hrs AEC -Q101
JESD22A-101
22/45/770/1
恒温恒湿实验
THT(Temp/Humidity Test)
Ta = 85℃ 85%RH JESD22-A10122/45/770/1
高温存储试验
HTSL(High Temperature Storage)
TA=150℃,1000Hrs JESD22-A103&A11322/45/770/1
不偏压高速老化
UHAST (Unbiased Temperature/Humidity)
130℃;85% RH ; 96hrs JESD22A-11822/45/770/1
温度循环
TC(Temperature Cycling)
-65℃~+150℃, Tdwell ≥10min,500 cycles JESD22-A10422/45/770/1
耐焊接热
RSH(Resistance to Solder Heat)
SDM: A111 or J-STD-020 THMD: B1016 JESD22A-A113
J-STD-020
100/1
易焊性
SD(Solder ability)
245℃,5s,solder area>95% JESD22-B102100/1

󰀆 测试能力

CDPT provides a complete range of Power device testing services including final testing and system level testing.

CDPT provide customers with a full range of test platforms covering test style of DC/EAS/ISO/RG/IFSM/IRSM.

Tester ModelsManufacturerSpecificationsTest style
STA2100STATECKorea2000V/100ADC
im1020STATECKorea1000V/20ADC
DTS1000JUNOJapan1000V/20ADC
351-TTTESECJapan2000V/50A(200A)DC
ITC55100ITCAmericanVdd max 150V;Peak I max 150A EAS
EAS2100/imEAS100STATECKorea Vdd max 100V ;Peak I max 100A; L=0.01~79.9MH EAS
TOS9201 KIKUSUIJapanDc max 6KV; Ac max 5KVISO
RG2009 STATECKoreaRG:0.5-50Ω;CG:400pF ~ 20nFRG
E4980ALAGLIENTChina.Beijing1.0000aF-999.9999EF;1.0000aΩ-999.9999EΩRG
PIF6000POWORLDChina.Taiwan VF:1mV~8000mV;IFS:0~200AIFSM
SSG6000POWORLDChina.Taiwan IR:0.1A~5.0A; VR:5.0V~300.0V IRSM

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